| Part Numbers | Manufacturer Name | Datasheet | Logic Type | Supply Voltage | Number of Bits | Operating Temperature | Mounting Type | Package / Case |
|---|---|---|---|---|---|---|---|---|
| SN74TVC3010PW | TEXAS INSTRUMENTS INC | Voltage Clamp | - | 10 | -40?C ~ 85?C | Surface Mount | 24-TSSOP (0.173", 4.40mm Width) | |
| SN74S283N | TEXAS INSTRUMENTS INC | Binary Full Adder with Fast Carry | 4.75 V ~ 5.25 V | 4 | 0?C ~ 70?C | Through Hole | 16-DIP (0.300", 7.62mm) | |
| SN74BCT8374ADW | TEXAS INSTRUMENTS INC | Scan Test Device with D-Type Edge-Triggered Flip-F | 4.5 V ~ 5.5 V | 8 | 0?C ~ 70?C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | |
| SN74BCT8240ADW | TEXAS INSTRUMENTS INC | Scan Test Device with Inverting Buffers | 4.5 V ~ 5.5 V | 8 | 0?C ~ 70?C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | |
| SN74BCT8373ANT | TEXAS INSTRUMENTS INC | Scan Test Device with D-Type Latches | 4.5 V ~ 5.5 V | 8 | 0?C ~ 70?C | Through Hole | 24-DIP (0.300", 7.62mm) | |
| SN74BCT8244ANT | TEXAS INSTRUMENTS INC | Scan Test Device with Buffers | 4.5 V ~ 5.5 V | 8 | 0?C ~ 70?C | Through Hole | 24-DIP (0.300", 7.62mm) | |
| SN74ABT8652DW | TEXAS INSTRUMENTS INC | Scan Test Device with Bus Transceiver and Register | 4.5 V ~ 5.5 V | 8 | -40?C ~ 85?C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | |
| SN74LS294N | TEXAS INSTRUMENTS INC | Programmable Frequency Dividers/Digital Timers | 4.75 V ~ 5.25 V | - | 0?C ~ 70?C | Through Hole | 16-DIP (0.300", 7.62mm) | |
| CD74HC283E | TEXAS INSTRUMENTS INC | Binary Full Adder with Fast Carry | 2 V ~ 6 V | 4 | -55?C ~ 125?C | Through Hole | 16-DIP (0.300", 7.62mm) | |
| SN74F283N | TEXAS INSTRUMENTS INC | Binary Full Adder with Fast Carry | 4.5 V ~ 5.5 V | 4 | 0?C ~ 70?C | Through Hole | 16-DIP (0.300", 7.62mm) |
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