SN74BCT8373ADW |
TEXAS INSTRUMENTS INC |
|
Scan Test Device with D-Type Latches
|
4.5 V ~ 5.5 V
|
8
|
0?C ~ 70?C
|
Surface Mount
|
24-SOIC (0.295", 7.50mm Width)
|
SN74BCT8373ADWE4 |
TEXAS INSTRUMENTS INC |
|
Scan Test Device with D-Type Latches
|
4.5 V ~ 5.5 V
|
8
|
0?C ~ 70?C
|
Surface Mount
|
24-SOIC (0.295", 7.50mm Width)
|
SN74BCT8373ADWG4 |
TEXAS INSTRUMENTS INC |
|
Scan Test Device with D-Type Latches
|
4.5 V ~ 5.5 V
|
8
|
0?C ~ 70?C
|
Surface Mount
|
24-SOIC (0.295", 7.50mm Width)
|
SN74BCT8373ANTE4 |
TEXAS INSTRUMENTS INC |
|
Scan Test Device with D-Type Latches
|
4.5 V ~ 5.5 V
|
8
|
0?C ~ 70?C
|
Through Hole
|
24-DIP (0.300", 7.62mm)
|
SN74BCT8373ADWR |
TEXAS INSTRUMENTS INC |
|
Scan Test Device with D-Type Latches
|
4.5 V ~ 5.5 V
|
8
|
0?C ~ 70?C
|
Surface Mount
|
24-SOIC (0.295", 7.50mm Width)
|
SN74BCT8373ADWRE4 |
TEXAS INSTRUMENTS INC |
|
Scan Test Device with D-Type Latches
|
4.5 V ~ 5.5 V
|
8
|
0?C ~ 70?C
|
Surface Mount
|
24-SOIC (0.295", 7.50mm Width)
|
SN74BCT8373ADWRG4 |
TEXAS INSTRUMENTS INC |
|
Scan Test Device with D-Type Latches
|
4.5 V ~ 5.5 V
|
8
|
0?C ~ 70?C
|
Surface Mount
|
24-SOIC (0.295", 7.50mm Width)
|
SN74BCT8373ANT |
TEXAS INSTRUMENTS INC |
|
Scan Test Device with D-Type Latches
|
4.5 V ~ 5.5 V
|
8
|
0?C ~ 70?C
|
Through Hole
|
24-DIP (0.300", 7.62mm)
|