SN74BCT8240ADWE4 |
TEXAS INSTRUMENTS INC |
|
Scan Test Device with Inverting Buffers
|
4.5 V ~ 5.5 V
|
8
|
0?C ~ 70?C
|
Surface Mount
|
24-SOIC (0.295", 7.50mm Width)
|
SN74BCT8240ADWG4 |
TEXAS INSTRUMENTS INC |
|
Scan Test Device with Inverting Buffers
|
4.5 V ~ 5.5 V
|
8
|
0?C ~ 70?C
|
Surface Mount
|
24-SOIC (0.295", 7.50mm Width)
|
SN74BCT8240ADWR |
TEXAS INSTRUMENTS INC |
|
Scan Test Device with Inverting Buffers
|
4.5 V ~ 5.5 V
|
8
|
0?C ~ 70?C
|
Surface Mount
|
24-SOIC (0.295", 7.50mm Width)
|
SN74BCT8240ADWRE4 |
TEXAS INSTRUMENTS INC |
|
Scan Test Device with Inverting Buffers
|
4.5 V ~ 5.5 V
|
8
|
0?C ~ 70?C
|
Surface Mount
|
24-SOIC (0.295", 7.50mm Width)
|
SN74BCT8240ANT |
TEXAS INSTRUMENTS INC |
|
Scan Test Device with Inverting Buffers
|
4.5 V ~ 5.5 V
|
8
|
0?C ~ 70?C
|
Through Hole
|
24-DIP (0.300", 7.62mm)
|
SN74BCT8240ANTE4 |
TEXAS INSTRUMENTS INC |
|
Scan Test Device with Inverting Buffers
|
4.5 V ~ 5.5 V
|
8
|
0?C ~ 70?C
|
Through Hole
|
24-DIP (0.300", 7.62mm)
|
SN74BCT8240ADWRG4 |
TEXAS INSTRUMENTS INC |
|
Scan Test Device with Inverting Buffers
|
4.5 V ~ 5.5 V
|
8
|
0?C ~ 70?C
|
Surface Mount
|
24-SOIC (0.295", 7.50mm Width)
|
SN74BCT8240ADW |
TEXAS INSTRUMENTS INC |
|
Scan Test Device with Inverting Buffers
|
4.5 V ~ 5.5 V
|
8
|
0?C ~ 70?C
|
Surface Mount
|
24-SOIC (0.295", 7.50mm Width)
|