Scan Test Device with Buffers,Logic Type
8 parts found
Part Numbers Manufacturer Name Datasheet Logic Type Supply Voltage Number of Bits Operating Temperature Mounting Type Package / Case
SN74BCT8244ADWR TEXAS INSTRUMENTS INC
Scan Test Device with Buffers 4.5 V ~ 5.5 V 8 0?C ~ 70?C Surface Mount 24-SOIC (0.295", 7.50mm Width)
SN74BCT8244ADWRE4 TEXAS INSTRUMENTS INC
Scan Test Device with Buffers 4.5 V ~ 5.5 V 8 0?C ~ 70?C Surface Mount 24-SOIC (0.295", 7.50mm Width)
SN74BCT8244ADWRG4 TEXAS INSTRUMENTS INC
Scan Test Device with Buffers 4.5 V ~ 5.5 V 8 0?C ~ 70?C Surface Mount 24-SOIC (0.295", 7.50mm Width)
SN74BCT8244ADW TEXAS INSTRUMENTS INC
Scan Test Device with Buffers 4.5 V ~ 5.5 V 8 0?C ~ 70?C Surface Mount 24-SOIC (0.295", 7.50mm Width)
SN74BCT8244ADWE4 TEXAS INSTRUMENTS INC
Scan Test Device with Buffers 4.5 V ~ 5.5 V 8 0?C ~ 70?C Surface Mount 24-SOIC (0.295", 7.50mm Width)
SN74BCT8244ADWG4 TEXAS INSTRUMENTS INC
Scan Test Device with Buffers 4.5 V ~ 5.5 V 8 0?C ~ 70?C Surface Mount 24-SOIC (0.295", 7.50mm Width)
SN74BCT8244ANTE4 TEXAS INSTRUMENTS INC
Scan Test Device with Buffers 4.5 V ~ 5.5 V 8 0?C ~ 70?C Through Hole 24-DIP (0.300", 7.62mm)
SN74BCT8244ANT TEXAS INSTRUMENTS INC
Scan Test Device with Buffers 4.5 V ~ 5.5 V 8 0?C ~ 70?C Through Hole 24-DIP (0.300", 7.62mm)