| Part Numbers | Manufacturer Name | Datasheet | Logic Type | Supply Voltage | Number of Bits | Operating Temperature | Mounting Type | Package / Case |
|---|---|---|---|---|---|---|---|---|
| CD40117BEE4 | TEXAS INSTRUMENTS INC | Programmable Terminator | 3 V ~ 18 V | 8 | -55?C ~ 125?C | Through Hole | 14-DIP (0.300", 7.62mm) | |
| SN74BCT29854NT | TEXAS INSTRUMENTS INC | 8-Bit to 9-Bit Parity Bus Transceiver | 4.5 V ~ 5.5 V | 8 | 0?C ~ 70?C | Through Hole | 24-DIP (0.300", 7.62mm) | |
| SN74BCT29854NTE4 | TEXAS INSTRUMENTS INC | 8-Bit to 9-Bit Parity Bus Transceiver | 4.5 V ~ 5.5 V | 8 | 0?C ~ 70?C | Through Hole | 24-DIP (0.300", 7.62mm) | |
| SN74BCT8244ANTE4 | TEXAS INSTRUMENTS INC | Scan Test Device with Buffers | 4.5 V ~ 5.5 V | 8 | 0?C ~ 70?C | Through Hole | 24-DIP (0.300", 7.62mm) | |
| SN74BCT8373ANTE4 | TEXAS INSTRUMENTS INC | Scan Test Device with D-Type Latches | 4.5 V ~ 5.5 V | 8 | 0?C ~ 70?C | Through Hole | 24-DIP (0.300", 7.62mm) | |
| SN74BCT8240ANT | TEXAS INSTRUMENTS INC | Scan Test Device with Inverting Buffers | 4.5 V ~ 5.5 V | 8 | 0?C ~ 70?C | Through Hole | 24-DIP (0.300", 7.62mm) | |
| SN74BCT8240ANTE4 | TEXAS INSTRUMENTS INC | Scan Test Device with Inverting Buffers | 4.5 V ~ 5.5 V | 8 | 0?C ~ 70?C | Through Hole | 24-DIP (0.300", 7.62mm) | |
| SN74BCT8245ANT | TEXAS INSTRUMENTS INC | Scan Test Device with Bus Transceivers | 4.5 V ~ 5.5 V | 8 | 0?C ~ 70?C | Through Hole | 24-DIP (0.300", 7.62mm) | |
| SN74BCT8245ANTE4 | TEXAS INSTRUMENTS INC | Scan Test Device with Bus Transceivers | 4.5 V ~ 5.5 V | 8 | 0?C ~ 70?C | Through Hole | 24-DIP (0.300", 7.62mm) | |
| SN74BCT8374ANT | TEXAS INSTRUMENTS INC | Scan Test Device with D-Type Edge-Triggered Flip-F | 4.5 V ~ 5.5 V | 8 | 0?C ~ 70?C | Through Hole | 24-DIP (0.300", 7.62mm) |
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