| Part Numbers | Manufacturer Name | Datasheet | Logic Type | Supply Voltage | Number of Bits | Operating Temperature | Mounting Type | Package / Case |
|---|---|---|---|---|---|---|---|---|
| SN74BCT8373ADW | TEXAS INSTRUMENTS INC | Scan Test Device with D-Type Latches | 4.5 V ~ 5.5 V | 8 | 0?C ~ 70?C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | |
| SN74BCT8373ADWE4 | TEXAS INSTRUMENTS INC | Scan Test Device with D-Type Latches | 4.5 V ~ 5.5 V | 8 | 0?C ~ 70?C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | |
| SN74BCT8373ADWG4 | TEXAS INSTRUMENTS INC | Scan Test Device with D-Type Latches | 4.5 V ~ 5.5 V | 8 | 0?C ~ 70?C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | |
| SN74BCT8373ANTE4 | TEXAS INSTRUMENTS INC | Scan Test Device with D-Type Latches | 4.5 V ~ 5.5 V | 8 | 0?C ~ 70?C | Through Hole | 24-DIP (0.300", 7.62mm) | |
| SN74BCT8373ADWR | TEXAS INSTRUMENTS INC | Scan Test Device with D-Type Latches | 4.5 V ~ 5.5 V | 8 | 0?C ~ 70?C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | |
| SN74BCT8373ADWRE4 | TEXAS INSTRUMENTS INC | Scan Test Device with D-Type Latches | 4.5 V ~ 5.5 V | 8 | 0?C ~ 70?C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | |
| SN74BCT8373ADWRG4 | TEXAS INSTRUMENTS INC | Scan Test Device with D-Type Latches | 4.5 V ~ 5.5 V | 8 | 0?C ~ 70?C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | |
| SN74BCT8373ANT | TEXAS INSTRUMENTS INC | Scan Test Device with D-Type Latches | 4.5 V ~ 5.5 V | 8 | 0?C ~ 70?C | Through Hole | 24-DIP (0.300", 7.62mm) |
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