SN74BCT8244ADWR |
TEXAS INSTRUMENTS INC |
|
Scan Test Device with Buffers
|
4.5 V ~ 5.5 V
|
8
|
0?C ~ 70?C
|
Surface Mount
|
24-SOIC (0.295", 7.50mm Width)
|
SN74BCT8244ADWRE4 |
TEXAS INSTRUMENTS INC |
|
Scan Test Device with Buffers
|
4.5 V ~ 5.5 V
|
8
|
0?C ~ 70?C
|
Surface Mount
|
24-SOIC (0.295", 7.50mm Width)
|
SN74BCT8244ADWRG4 |
TEXAS INSTRUMENTS INC |
|
Scan Test Device with Buffers
|
4.5 V ~ 5.5 V
|
8
|
0?C ~ 70?C
|
Surface Mount
|
24-SOIC (0.295", 7.50mm Width)
|
SN74BCT8244ADW |
TEXAS INSTRUMENTS INC |
|
Scan Test Device with Buffers
|
4.5 V ~ 5.5 V
|
8
|
0?C ~ 70?C
|
Surface Mount
|
24-SOIC (0.295", 7.50mm Width)
|
SN74BCT8244ADWE4 |
TEXAS INSTRUMENTS INC |
|
Scan Test Device with Buffers
|
4.5 V ~ 5.5 V
|
8
|
0?C ~ 70?C
|
Surface Mount
|
24-SOIC (0.295", 7.50mm Width)
|
SN74BCT8244ADWG4 |
TEXAS INSTRUMENTS INC |
|
Scan Test Device with Buffers
|
4.5 V ~ 5.5 V
|
8
|
0?C ~ 70?C
|
Surface Mount
|
24-SOIC (0.295", 7.50mm Width)
|
SN74BCT8244ANTE4 |
TEXAS INSTRUMENTS INC |
|
Scan Test Device with Buffers
|
4.5 V ~ 5.5 V
|
8
|
0?C ~ 70?C
|
Through Hole
|
24-DIP (0.300", 7.62mm)
|
SN74BCT8244ANT |
TEXAS INSTRUMENTS INC |
|
Scan Test Device with Buffers
|
4.5 V ~ 5.5 V
|
8
|
0?C ~ 70?C
|
Through Hole
|
24-DIP (0.300", 7.62mm)
|