| Part Numbers | Manufacturer Name | Datasheet | Logic Type | Supply Voltage | Number of Bits | Operating Temperature | Mounting Type | Package / Case |
|---|---|---|---|---|---|---|---|---|
| SN74BCT8374ADWE4 | TEXAS INSTRUMENTS INC | Scan Test Device with D-Type Edge-Triggered Flip-F | 4.5 V ~ 5.5 V | 8 | 0?C ~ 70?C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | |
| SN74BCT8374ADWG4 | TEXAS INSTRUMENTS INC | Scan Test Device with D-Type Edge-Triggered Flip-F | 4.5 V ~ 5.5 V | 8 | 0?C ~ 70?C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | |
| SN74BCT8374ADWR | TEXAS INSTRUMENTS INC | Scan Test Device with D-Type Edge-Triggered Flip-F | 4.5 V ~ 5.5 V | 8 | 0?C ~ 70?C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | |
| SN74BCT8374ADWRE4 | TEXAS INSTRUMENTS INC | Scan Test Device with D-Type Edge-Triggered Flip-F | 4.5 V ~ 5.5 V | 8 | 0?C ~ 70?C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | |
| SN74BCT8374ADWRG4 | TEXAS INSTRUMENTS INC | Scan Test Device with D-Type Edge-Triggered Flip-F | 4.5 V ~ 5.5 V | 8 | 0?C ~ 70?C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | |
| SN74BCT8374ADW | TEXAS INSTRUMENTS INC | Scan Test Device with D-Type Edge-Triggered Flip-F | 4.5 V ~ 5.5 V | 8 | 0?C ~ 70?C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) |
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