BYC10-600,127 |
NXP SEMICONDUCTORS |
|
Standard
|
500V
|
10A
|
2.9V @ 10A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
55ns
|
200µA @ 600V
|
-
|
2°C/W Jl
|
150°C (Max)
|
Through Hole
|
TO-220-2
|
BYT79-500,127 |
NXP SEMICONDUCTORS |
|
Standard
|
500V
|
14A
|
1.38V @ 30A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
60ns
|
50µA @ 500V
|
-
|
2°C/W Jl
|
150°C (Max)
|
Through Hole
|
TO-220-2
|
BYT79-600,127 |
NXP SEMICONDUCTORS |
|
Standard
|
600V
|
15A
|
1.38V @ 15A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
60ns
|
50µA @ 600V
|
-
|
2°C/W Jl
|
150°C (Max)
|
Through Hole
|
TO-220-2
|
BYC10B-600,118 |
NXP SEMICONDUCTORS |
|
Standard
|
500V
|
10A
|
2.9V @ 10A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
55ns
|
200µA @ 600V
|
-
|
2°C/W Jl
|
150°C (Max)
|
Surface Mount
|
TO-263-3, D²Pak (2 Leads + Tab), TO-263AB
|
BY359-1500,127 |
NXP SEMICONDUCTORS |
|
Standard
|
1500V (1.5kV)
|
10A (DC)
|
1.8V @ 20A
|
Standard Recovery >500ns, > 200mA (Io)
|
600ns
|
100µA @ 1300V
|
-
|
2°C/W Jl
|
150°C (Max)
|
Through Hole
|
TO-220-2
|
BY329-1500S,127 |
NXP SEMICONDUCTORS |
|
Standard
|
1500V (1.5kV)
|
6A (DC)
|
1.6V @ 6.5A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
160ns
|
250µA @ 1300V
|
-
|
2°C/W Jl
|
150°C (Max)
|
Through Hole
|
TO-220-2
|
BY329-1000,127 |
NXP SEMICONDUCTORS |
|
Standard
|
1000V (1kV)
|
8A
|
1.85V @ 20A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
135ns
|
1mA @ 800V
|
-
|
2°C/W Jl
|
150°C (Max)
|
Through Hole
|
TO-220-2
|
BY329-1200,127 |
NXP SEMICONDUCTORS |
|
Standard
|
1200V (1.2kV)
|
8A
|
1.85V @ 20A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
135ns
|
1mA @ 1000V
|
-
|
2°C/W Jl
|
150°C (Max)
|
Through Hole
|
TO-220-2
|
BYV79E-200,127 |
NXP SEMICONDUCTORS |
|
Standard
|
200V
|
14A
|
1.05V @ 14A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
30ns
|
50µA @ 200V
|
-
|
2°C/W Jl
|
150°C (Max)
|
Through Hole
|
TO-220-2
|