BYC8D-600,127 |
NXP SEMICONDUCTORS |
|
Standard
|
600V
|
8A
|
2.9V @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
20ns
|
40µA @ 600V
|
-
|
2.5°C/W Jl
|
150°C (Max)
|
Through Hole
|
TO-220-2
|
BYV29-500,127 |
NXP SEMICONDUCTORS |
|
Standard
|
500V
|
9A
|
1.25V @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
60ns
|
50µA @ 500V
|
-
|
2.5°C/W Jl
|
150°C (Max)
|
Through Hole
|
TO-220-2
|
BYV29F-600,127 |
NXP SEMICONDUCTORS |
|
Standard
|
600V
|
9A
|
1.9V @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
35ns
|
50µA @ 600V
|
-
|
2.5°C/W Jl
|
150°C (Max)
|
Through Hole
|
TO-220-2
|
BYC8-600,127 |
NXP SEMICONDUCTORS |
|
Standard
|
600V
|
8A
|
2.9V @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
52ns
|
150µA @ 600V
|
-
|
2.2°C/W Jl
|
150°C (Max)
|
Through Hole
|
TO-220-2
|
BYV29-600,127 |
NXP SEMICONDUCTORS |
|
Standard
|
600V
|
9A
|
1.25V @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
60ns
|
50µA @ 600V
|
-
|
2.5°C/W Jl
|
150°C (Max)
|
Through Hole
|
TO-220-2
|
BYC10-600,127 |
NXP SEMICONDUCTORS |
|
Standard
|
500V
|
10A
|
2.9V @ 10A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
55ns
|
200µA @ 600V
|
-
|
2°C/W Jl
|
150°C (Max)
|
Through Hole
|
TO-220-2
|
BYT79-500,127 |
NXP SEMICONDUCTORS |
|
Standard
|
500V
|
14A
|
1.38V @ 30A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
60ns
|
50µA @ 500V
|
-
|
2°C/W Jl
|
150°C (Max)
|
Through Hole
|
TO-220-2
|
BYC5-600,127 |
NXP SEMICONDUCTORS |
|
Standard
|
500V
|
5A
|
2.9V @ 5A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
50ns
|
100µA @ 600V
|
-
|
2.5°C/W Jl
|
150°C (Max)
|
Through Hole
|
TO-220-2
|
BYC5D-500,127 |
NXP SEMICONDUCTORS |
|
Standard
|
500V
|
5A
|
2V @ 5A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
16ns
|
40µA @ 500V
|
-
|
2.5°C/W Jl
|
150°C (Max)
|
Through Hole
|
TO-220-2
|
BYC15-600,127 |
NXP SEMICONDUCTORS |
|
Standard
|
500V
|
15A
|
2.9V @ 15A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
55ns
|
200µA @ 600V
|
-
|
1.5°C/W Jl
|
150°C (Max)
|
Through Hole
|
TO-220-2
|