| Part Numbers | Manufacturer Name | Datasheet | Diode Type | Reverse DC Voltage(Vr) | Current - Average Rectified (Io) | Forward Voltage (Vf) | Speed | Reverse Recovery Time (trr) | Reverse Leakage Current @ Vr | Capacitance @ Vr, F | Thermal Resistance | Operating Temperature - Junction | Mounting Type | Package / Case |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| BAW62,113 | NXP SEMICONDUCTORS | Standard | 75V | 250mA (DC) | 1V @ 100mA | Fast Recovery =< 500ns, > 200mA (Io) | 4ns | 5µA @ 75V | 2pF @ 0V, 1MHz | - | - | Through Hole | DO-204AH, DO-35, Axial | |
| BAS45A,113 | NXP SEMICONDUCTORS | Standard | 125V | 250mA (DC) | 1V @ 100mA | Standard Recovery >500ns, > 200mA (Io) | 1.5µs | 1nA @ 125V | 4pF @ 0V, 1MHz | - | - | Through Hole | DO-204AG, DO-34, Axial | |
| BYC10-600PQ | NXP SEMICONDUCTORS | Standard | 600V | 10A | 1.8V @ 10A | Fast Recovery =< 500ns, > 200mA (Io) | 19ns | - | - | - | 150°C (Max) | Through Hole | TO-220-2 | |
| BYW29E-100,127 | NXP SEMICONDUCTORS | Standard | 100V | 8A | 1.05V @ 8A | Fast Recovery =< 500ns, > 200mA (Io) | 25ns | 10µA @ 100V | - | - | - | Through Hole | TO-220-2 |
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