BAV21,113 |
NXP SEMICONDUCTORS |
|
Standard
|
200V
|
250mA (DC)
|
1.25V @ 200mA
|
Fast Recovery =< 500ns, > 200mA (Io)
|
50ns
|
100nA @ 200V
|
5pF @ 0V, 1MHz
|
375°C/W Ja
|
175°C (Max)
|
Through Hole
|
DO-204AH, DO-35, Axial
|
BAV21,143 |
NXP SEMICONDUCTORS |
|
Standard
|
200V
|
250mA (DC)
|
1.25V @ 200mA
|
Fast Recovery =< 500ns, > 200mA (Io)
|
50ns
|
100nA @ 200V
|
5pF @ 0V, 1MHz
|
375°C/W Ja
|
175°C (Max)
|
Through Hole
|
DO-204AH, DO-35, Axial
|
BAV21,133 |
NXP SEMICONDUCTORS |
|
Standard
|
200V
|
250mA (DC)
|
1.25V @ 200mA
|
Fast Recovery =< 500ns, > 200mA (Io)
|
50ns
|
100nA @ 200V
|
5pF @ 0V, 1MHz
|
375°C/W Ja
|
175°C (Max)
|
Through Hole
|
DO-204AH, DO-35, Axial
|
BYW29EX-200,127 |
NXP SEMICONDUCTORS |
|
Standard
|
200V
|
8A
|
1.05V @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
10µA @ 200V
|
-
|
7.2°C/W Jh
|
150°C (Max)
|
Through Hole
|
TO-220-2 Full Pack, Isolated Tab
|
BYW29E-200,127 |
NXP SEMICONDUCTORS |
|
Standard
|
200V
|
8A
|
1.05V @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
10µA @ 200V
|
-
|
2.7°C/W Jl
|
150°C (Max)
|
Through Hole
|
TO-220-2
|
BYV79E-200,127 |
NXP SEMICONDUCTORS |
|
Standard
|
200V
|
14A
|
1.05V @ 14A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
30ns
|
50µA @ 200V
|
-
|
2°C/W Jl
|
150°C (Max)
|
Through Hole
|
TO-220-2
|