BYV74W-400,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
400V
|
30A
|
1.36V @ 30A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
60ns
|
50µA @ 400V
|
Through Hole
|
TO-247-3
|
BYV72EW-200,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
200V
|
30A
|
1.2V @ 30A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
28ns
|
100µA @ 200V
|
Through Hole
|
TO-247-3
|
BYV32E-200,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
200V
|
20A
|
1.15V @ 20A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
30µA @ 200V
|
Through Hole
|
TO-220-3
|
BYV42E-200,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
200V
|
30A
|
1.2V @ 30A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
28ns
|
100µA @ 200V
|
Through Hole
|
TO-220-3
|
BYV34X-600,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
600V
|
20A
|
1.36V @ 10A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
60ns
|
50µA @ 600V
|
Through Hole
|
TO-220-3 Isolated Tab
|
BYV410X-600,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
600V
|
20A
|
2.1V @ 10A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
35ns
|
50µA @ 600V
|
Through Hole
|
TO-220-3 Isolated Tab
|
BYQ28E-200,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
200V
|
10A
|
1.25V @ 10A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
10µA @ 200V
|
Through Hole
|
TO-220-3
|
BYQ28E-200/H,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
200V
|
10A
|
1.25V @ 10A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
10µA @ 200V
|
Through Hole
|
TO-220-3
|
BYQ28X-200,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
200V
|
10A
|
1.25V @ 10A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
10µA @ 200V
|
Through Hole
|
TO-220-3 Isolated Tab
|
BYC10-600CT,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
600V
|
10A
|
2.9V @ 5A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
50ns
|
100µA @ 600V
|
Through Hole
|
TO-220-3
|