BYV32E-200,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
200V
|
20A
|
1.15V @ 20A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
30µA @ 200V
|
Through Hole
|
TO-220-3
|
BYV34X-600,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
600V
|
20A
|
1.36V @ 10A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
60ns
|
50µA @ 600V
|
Through Hole
|
TO-220-3 Isolated Tab
|
BYV410X-600,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
600V
|
20A
|
2.1V @ 10A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
35ns
|
50µA @ 600V
|
Through Hole
|
TO-220-3 Isolated Tab
|
BYV34-400,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
400V
|
20A
|
1.35V @ 20A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
60ns
|
50µA @ 400V
|
Through Hole
|
TO-220-3
|
BYV32E-100,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
100V
|
20A
|
1.15V @ 20A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
30µA @ 100V
|
Through Hole
|
TO-220-3
|
BYV34G-600,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
600V
|
20A
|
1.48V @ 20A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
60ns
|
50µA @ 600V
|
Through Hole
|
TO-262-3 Long Leads, I²Pak, TO-262AA
|
BYV34-500,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
500V
|
20A
|
1.35V @ 20A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
60ns
|
50µA @ 500V
|
Through Hole
|
TO-220-3
|
BYV34-600,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
600V
|
20A
|
1.48V @ 20A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
60ns
|
50µA @ 600V
|
Through Hole
|
TO-220-3
|
BYV410-600,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
600V
|
20A
|
2.1V @ 10A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
35ns
|
50µA @ 600V
|
Through Hole
|
TO-220-3
|
BYV32EB-200,118 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
200V
|
20A
|
1.15V @ 20A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
30µA @ 200V
|
Surface Mount
|
TO-263-3, D²Pak (2 Leads + Tab), TO-263AB
|