BYV32E-200,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
200V
|
20A
|
1.15V @ 20A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
30µA @ 200V
|
Through Hole
|
TO-220-3
|
BYV42E-200,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
200V
|
30A
|
1.2V @ 30A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
28ns
|
100µA @ 200V
|
Through Hole
|
TO-220-3
|
BYQ28E-200,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
200V
|
10A
|
1.25V @ 10A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
10µA @ 200V
|
Through Hole
|
TO-220-3
|
BYQ28E-200/H,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
200V
|
10A
|
1.25V @ 10A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
10µA @ 200V
|
Through Hole
|
TO-220-3
|
BYC10-600CT,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
600V
|
10A
|
2.9V @ 5A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
50ns
|
100µA @ 600V
|
Through Hole
|
TO-220-3
|
BYV34-400,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
400V
|
20A
|
1.35V @ 20A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
60ns
|
50µA @ 400V
|
Through Hole
|
TO-220-3
|
BYV32E-100,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
100V
|
20A
|
1.15V @ 20A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
30µA @ 100V
|
Through Hole
|
TO-220-3
|
NXPS20H110C,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Schottky
|
110V
|
10A
|
770mV @ 10A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
-
|
6µA @ 110V
|
Through Hole
|
TO-220-3
|
BYV34-500,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
500V
|
20A
|
1.35V @ 20A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
60ns
|
50µA @ 500V
|
Through Hole
|
TO-220-3
|
BYV34-600,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
600V
|
20A
|
1.48V @ 20A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
60ns
|
50µA @ 600V
|
Through Hole
|
TO-220-3
|