RURP8100 |
FAIRCHILD SEMICONDUCTOR CORP |
|
Standard
|
1000V (1kV)
|
8A
|
1.8V @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
100ns
|
100µA @ 1000V
|
-
|
2°C/W Jc
|
-55°C ~ 175°C
|
Through Hole
|
TO-220-2
|
MUR8100EG |
ON SEMICONDUCTOR |
|
Standard
|
1000V (1kV)
|
8A
|
1.8V @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
100ns
|
25µA @ 1000V
|
-
|
2°C/W Jc
|
-65°C ~ 175°C
|
Through Hole
|
TO-220-2
|
MUR880EG |
ON SEMICONDUCTOR |
|
Standard
|
800V
|
8A
|
1.8V @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
100ns
|
25µA @ 800V
|
-
|
2°C/W Jc
|
-65°C ~ 175°C
|
Through Hole
|
TO-220-2
|
C3D08065A |
CREE INC |
|
Silicon Carbide Schottky
|
650V
|
8A
|
1.8V @ 8A
|
No Recovery Time > 500mA (Io)
|
0ns
|
60µA @ 650V
|
441pF @ 0V, 1MHz
|
1.5°C/W Jc
|
-55°C ~ 175°C
|
Through Hole
|
TO-220-2
|
C3D08065I |
CREE INC |
|
Silicon Carbide Schottky
|
650V
|
8A (DC)
|
1.8V @ 8A
|
No Recovery Time > 500mA (Io)
|
0ns
|
60µA @ 650V
|
441pF @ 0V, 1MHz
|
3.1°C/W Jc
|
-55°C ~ 175°C
|
Through Hole
|
TO-220-2 Isolated Tab
|
CSD08060A |
CREE INC |
|
Silicon Carbide Schottky
|
600V
|
12.5A
|
1.8V @ 8A
|
No Recovery Time > 500mA (Io)
|
0ns
|
200µA @ 600V
|
470pF @ 0V, 1MHz
|
1.4°C/W Jc
|
-55°C ~ 175°C
|
Through Hole
|
TO-220-2
|
C3D08060A |
CREE INC |
|
Silicon Carbide Schottky
|
600V
|
8A
|
1.8V @ 8A
|
No Recovery Time > 500mA (Io)
|
0ns
|
50µA @ 600V
|
441pF @ 0V, 1MHz
|
1.5°C/W Jc
|
-55°C ~ 175°C
|
Through Hole
|
TO-220-2
|
C3D08060G |
CREE INC |
|
Silicon Carbide Schottky
|
600V
|
8A
|
1.8V @ 8A
|
No Recovery Time > 500mA (Io)
|
0ns
|
50µA @ 600V
|
441pF @ 0V, 1MHz
|
1.4°C/W Jc
|
-55°C ~ 175°C
|
Surface Mount
|
TO-263-3, D²Pak (2 Leads + Tab), TO-263AB
|
MUR8100E |
FAIRCHILD SEMICONDUCTOR CORP |
|
Standard
|
1000V (1kV)
|
8A
|
1.8V @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
100ns
|
100µA @ 1000V
|
-
|
2°C/W Jc
|
-55°C ~ 175°C
|
Through Hole
|
TO-220-2
|
MUR880E |
ON SEMICONDUCTOR |
|
Standard
|
800V
|
8A
|
1.8V @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
100ns
|
25µA @ 800V
|
-
|
2°C/W Jc
|
-65°C ~ 175°C
|
Through Hole
|
TO-220-2
|