BYW29-200G |
ON SEMICONDUCTOR |
|
Standard
|
200V
|
8A
|
1.3V @ 20A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
35ns
|
5µA @ 200V
|
-
|
3°C/W Jc
|
-65°C ~ 175°C
|
Through Hole
|
TO-220-2
|
MUR820G |
ON SEMICONDUCTOR |
|
Standard
|
200V
|
8A
|
975mV @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
35ns
|
5µA @ 200V
|
-
|
3°C/W Jc
|
-65°C ~ 175°C
|
Through Hole
|
TO-220-2
|
BYW80-200G |
ON SEMICONDUCTOR |
|
Standard
|
200V
|
8A
|
1.25V @ 22A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
35ns
|
10µA @ 200V
|
-
|
3°C/W Jc
|
-65°C ~ 175°C
|
Through Hole
|
TO-220-2
|
STTH802D |
STMICROELECTRONICS |
|
Standard
|
200V
|
8A
|
1.05V @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
30ns
|
6µA @ 200V
|
-
|
3.2°C/W Jc
|
175°C (Max)
|
Through Hole
|
TO-220-2
|
FR803 |
DIODES INC |
|
Standard
|
200V
|
8A
|
1.3V @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
150ns
|
10µA @ 200V
|
-
|
-
|
-65°C ~ 175°C
|
Through Hole
|
TO-220-2
|
DSEP8-02A |
IXYS CORP |
|
Standard
|
200V
|
8A
|
1.3V @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
50µA @ 200V
|
-
|
0.5°C/W Cs
|
-55°C ~ 175°C
|
Through Hole
|
TO-220-2
|
BYW29ED-200,118 |
NXP SEMICONDUCTORS |
|
Standard
|
200V
|
8A
|
1.05V @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
10µA @ 200V
|
-
|
2.7°C/W Jl
|
150°C (Max)
|
Surface Mount
|
TO-252-3, DPak (2 Leads + Tab), SC-63
|
BYW29EX-200,127 |
NXP SEMICONDUCTORS |
|
Standard
|
200V
|
8A
|
1.05V @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
10µA @ 200V
|
-
|
7.2°C/W Jh
|
150°C (Max)
|
Through Hole
|
TO-220-2 Full Pack, Isolated Tab
|
BYW29E-200,127 |
NXP SEMICONDUCTORS |
|
Standard
|
200V
|
8A
|
1.05V @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
10µA @ 200V
|
-
|
2.7°C/W Jl
|
150°C (Max)
|
Through Hole
|
TO-220-2
|
MUR820 |
ON SEMICONDUCTOR |
|
Standard
|
200V
|
8A
|
975mV @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
35ns
|
5µA @ 200V
|
-
|
3°C/W Jc
|
-65°C ~ 175°C
|
Through Hole
|
TO-220-2
|