| Part Numbers | Manufacturer Name | Datasheet | Diode Type | Reverse DC Voltage(Vr) | Current - Average Rectified (Io) | Forward Voltage (Vf) | Speed | Reverse Recovery Time (trr) | Reverse Leakage Current @ Vr | Capacitance @ Vr, F | Thermal Resistance | Operating Temperature - Junction | Mounting Type | Package / Case |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| FFPF08H60STU | FAIRCHILD SEMICONDUCTOR CORP | Standard | 600V | 8A | 2.1V @ 8A | Fast Recovery =< 500ns, > 200mA (Io) | 45ns | 100µA @ 600V | - | 3.4°C/W Jc | -65°C ~ 150°C | Through Hole | TO-220-2 Full Pack, Isolated Tab | |
| FFPF08S60SNTU | FAIRCHILD SEMICONDUCTOR CORP | Standard | 600V | 8A | 3.4V @ 8A | Fast Recovery =< 500ns, > 200mA (Io) | 25ns | 100µA @ 600V | - | 6.8°C/W Jc | -65°C ~ 150°C | Through Hole | TO-220-2 Full Pack, Isolated Tab | |
| FFPF08S60STU | FAIRCHILD SEMICONDUCTOR CORP | Standard | 600V | 8A | 2.6V @ 8A | Fast Recovery =< 500ns, > 200mA (Io) | 30ns | 100µA @ 600V | - | 3.4°C/W Jc | -65°C ~ 150°C | Through Hole | TO-220-2 Full Pack, Isolated Tab | |
| ISL9R860PF2 | FAIRCHILD SEMICONDUCTOR CORP | Standard | 600V | 8A | 2.4V @ 8A | Fast Recovery =< 500ns, > 200mA (Io) | 30ns | 100µA @ 600V | - | 4.8°C/W Jc | -55°C ~ 150°C | Through Hole | TO-220-2 Full Pack, Isolated Tab | |
| BYC8DX-600,127 | NXP SEMICONDUCTORS | Standard | 600V | 8A | 2.9V @ 8A | Fast Recovery =< 500ns, > 200mA (Io) | 20ns | 40µA @ 600V | - | 7.2°C/W Jh | 150°C (Max) | Through Hole | TO-220-2 Full Pack, Isolated Tab | |
| BYR29X-800,127 | NXP SEMICONDUCTORS | Standard | 800V | 8A | 1.7V @ 8A | Fast Recovery =< 500ns, > 200mA (Io) | 75ns | 10µA @ 800V | - | 2.5°C/W Jl | 150°C (Max) | Through Hole | TO-220-2 Full Pack, Isolated Tab | |
| BYC8X-600,127 | NXP SEMICONDUCTORS | Standard | 600V | 8A | 2.9V @ 8A | Fast Recovery =< 500ns, > 200mA (Io) | 52ns | 150µA @ 600V | - | 4.8°C/W Jh | 150°C (Max) | Through Hole | TO-220-2 Full Pack, Isolated Tab | |
| BYC58X-600,127 | NXP SEMICONDUCTORS | Standard | 600V | 8A | 3.2V @ 8A | Fast Recovery =< 500ns, > 200mA (Io) | 12.5ns | 150µA @ 600V | - | 3°C/W Jh | 150°C (Max) | Through Hole | TO-220-2 Full Pack, Isolated Tab | |
| BYC8X-600P,127 | NXP SEMICONDUCTORS | Standard | 600V | 8A | 1.9V @ 8A | Fast Recovery =< 500ns, > 200mA (Io) | 18ns | 20µA @ 600V | - | 7.2°C/W Jh | 175°C (Max) | Through Hole | TO-220-2 Full Pack, Isolated Tab | |
| BYR29X-600,127 | NXP SEMICONDUCTORS | Standard | 600V | 8A | 1.7V @ 8A | Fast Recovery =< 500ns, > 200mA (Io) | 75ns | 10µA @ 600V | - | 2.5°C/W Jl | 150°C (Max) | Through Hole | TO-220-2 Full Pack, Isolated Tab |
© 2016 Copyright
