RURP8100 |
FAIRCHILD SEMICONDUCTOR CORP |
|
Standard
|
1000V (1kV)
|
8A
|
1.8V @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
100ns
|
100µA @ 1000V
|
-
|
2°C/W Jc
|
-55°C ~ 175°C
|
Through Hole
|
TO-220-2
|
DSEI12-10A |
IXYS CORP |
|
Standard
|
1000V (1kV)
|
12A
|
2.7V @ 12A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
60ns
|
250µA @ 1000V
|
-
|
0.5°C/W Cs
|
-40°C ~ 150°C
|
Through Hole
|
TO-220-2
|
MUR8100EG |
ON SEMICONDUCTOR |
|
Standard
|
1000V (1kV)
|
8A
|
1.8V @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
100ns
|
25µA @ 1000V
|
-
|
2°C/W Jc
|
-65°C ~ 175°C
|
Through Hole
|
TO-220-2
|
STTH1210D |
STMICROELECTRONICS |
|
Standard
|
1000V (1kV)
|
12A
|
2V @ 12A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
90ns
|
10µA @ 1000V
|
-
|
1.9°C/W Jc
|
175°C (Max)
|
Through Hole
|
TO-220-2
|
STTH3010D |
STMICROELECTRONICS |
|
Standard
|
1000V (1kV)
|
30A
|
2V @ 30A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
100ns
|
15µA @ 1000V
|
-
|
1.1°C/W Jc
|
175°C (Max)
|
Through Hole
|
TO-220-2
|
MUR8100E |
FAIRCHILD SEMICONDUCTOR CORP |
|
Standard
|
1000V (1kV)
|
8A
|
1.8V @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
100ns
|
100µA @ 1000V
|
-
|
2°C/W Jc
|
-55°C ~ 175°C
|
Through Hole
|
TO-220-2
|
RURP15100 |
FAIRCHILD SEMICONDUCTOR CORP |
|
Standard
|
1000V (1kV)
|
15A
|
1.8V @ 15A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
125ns
|
100µA @ 1000V
|
-
|
1.5°C/W Jc
|
-65°C ~ 175°C
|
Through Hole
|
TO-220-2
|
APT30DQ100KG |
MICROSEMI POWER PRODUCTS GROUP |
|
Standard
|
1000V (1kV)
|
30A
|
3V @ 30A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
295ns
|
100µA @ 1000V
|
-
|
0.8°C/W Jc
|
-55°C ~ 175°C
|
Through Hole, Radial
|
TO-220-2
|
BY329-1000,127 |
NXP SEMICONDUCTORS |
|
Standard
|
1000V (1kV)
|
8A
|
1.85V @ 20A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
135ns
|
1mA @ 800V
|
-
|
2°C/W Jl
|
150°C (Max)
|
Through Hole
|
TO-220-2
|
MUR8100E |
ON SEMICONDUCTOR |
|
Standard
|
1000V (1kV)
|
8A
|
1.8V @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
100ns
|
25µA @ 1000V
|
-
|
2°C/W Jc
|
-65°C ~ 175°C
|
Through Hole
|
TO-220-2
|