RURP8100 |
FAIRCHILD SEMICONDUCTOR CORP |
|
Standard
|
1000V (1kV)
|
8A
|
1.8V @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
100ns
|
100µA @ 1000V
|
-
|
2°C/W Jc
|
-55°C ~ 175°C
|
Through Hole
|
TO-220-2
|
MUR8100EG |
ON SEMICONDUCTOR |
|
Standard
|
1000V (1kV)
|
8A
|
1.8V @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
100ns
|
25µA @ 1000V
|
-
|
2°C/W Jc
|
-65°C ~ 175°C
|
Through Hole
|
TO-220-2
|
MUR880EG |
ON SEMICONDUCTOR |
|
Standard
|
800V
|
8A
|
1.8V @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
100ns
|
25µA @ 800V
|
-
|
2°C/W Jc
|
-65°C ~ 175°C
|
Through Hole
|
TO-220-2
|
STTH8R03D |
STMICROELECTRONICS |
|
Standard
|
300V
|
8A
|
1.8V @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
30ns
|
10µA @ 300V
|
-
|
2.5°C/W Jc
|
175°C (Max)
|
Through Hole
|
TO-220-2
|
MUR8100E |
FAIRCHILD SEMICONDUCTOR CORP |
|
Standard
|
1000V (1kV)
|
8A
|
1.8V @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
100ns
|
100µA @ 1000V
|
-
|
2°C/W Jc
|
-55°C ~ 175°C
|
Through Hole
|
TO-220-2
|
MUR880E |
ON SEMICONDUCTOR |
|
Standard
|
800V
|
8A
|
1.8V @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
100ns
|
25µA @ 800V
|
-
|
2°C/W Jc
|
-65°C ~ 175°C
|
Through Hole
|
TO-220-2
|
MUR8100E |
ON SEMICONDUCTOR |
|
Standard
|
1000V (1kV)
|
8A
|
1.8V @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
100ns
|
25µA @ 1000V
|
-
|
2°C/W Jc
|
-65°C ~ 175°C
|
Through Hole
|
TO-220-2
|