NUR460,133 |
NXP SEMICONDUCTORS |
|
Standard
|
600V
|
4A
|
1.28V @ 4A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
60ns
|
50µA @ 600V
|
-
|
55°C/W Ja
|
150°C (Max)
|
Through Hole
|
DO-201AD, Axial
|
NUR460/L02,112 |
NXP SEMICONDUCTORS |
|
Standard
|
600V
|
4A
|
1.28V @ 4A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
65ns
|
50µA @ 600V
|
-
|
55°C/W Ja
|
150°C (Max)
|
Through Hole
|
DO-201AD, Axial
|
NUR460/L03,112 |
NXP SEMICONDUCTORS |
|
Standard
|
600V
|
4A
|
1.28V @ 4A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
65ns
|
50µA @ 600V
|
-
|
55°C/W Ja
|
150°C (Max)
|
Through Hole
|
DO-201AD, Axial
|
NUR460/L01,112 |
NXP SEMICONDUCTORS |
|
Standard
|
600V
|
4A
|
1.28V @ 4A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
65ns
|
50µA @ 600V
|
-
|
55°C/W Ja
|
150°C (Max)
|
Through Hole
|
DO-201AD, Axial
|
NUR460/L04,112 |
NXP SEMICONDUCTORS |
|
Standard
|
600V
|
4A
|
1.28V @ 4A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
65ns
|
50µA @ 600V
|
-
|
55°C/W Ja
|
150°C (Max)
|
Through Hole
|
DO-201AD, Axial
|
DLE30C |
ON SEMICONDUCTOR |
|
Standard
|
200V
|
3A
|
980mV @ 3A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
35ns
|
10µA @ 400V
|
-
|
80°C/W Ja
|
150°C (Max)
|
Through Hole
|
DO-201AD, Axial
|
DLE30C-KC9 |
ON SEMICONDUCTOR |
|
Standard
|
200V
|
3A
|
980mV @ 3A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
35ns
|
10µA @ 400V
|
-
|
80°C/W Ja
|
150°C (Max)
|
Through Hole
|
DO-201AD, Axial
|
DLE30E |
ON SEMICONDUCTOR |
|
Standard
|
400V
|
3A
|
1.25V @ 1A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
30ns
|
20µA @ 400V
|
-
|
80°C/W Ja
|
150°C (Max)
|
Through Hole
|
DO-201AD, Axial
|
BYW98-200RL |
STMICROELECTRONICS |
|
Standard
|
200V
|
3A
|
1.2V @ 9A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
35ns
|
10µA @ 200V
|
-
|
25°C/W Ja
|
150°C (Max)
|
Through Hole
|
DO-201AD, Axial
|
BYW98-200 |
STMICROELECTRONICS |
|
Standard
|
200V
|
3A
|
1.2V @ 9A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
35ns
|
10µA @ 200V
|
-
|
25°C/W Ja
|
150°C (Max)
|
Through Hole
|
DO-201AD, Axial
|