DSEC16-02A |
IXYS CORP |
|
1 Pair Common Cathode
|
Standard
|
200V
|
8A
|
1.3V @ 8A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
50µA @ 200V
|
Through Hole
|
TO-220-3
|
DSEC29-02A |
IXYS CORP |
|
1 Pair Common Cathode
|
Standard
|
200V
|
15A
|
1.06V @ 15A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
100µA @ 200V
|
Through Hole
|
TO-220-3
|
BYV32E-200,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
200V
|
20A
|
1.15V @ 20A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
30µA @ 200V
|
Through Hole
|
TO-220-3
|
BYQ28E-200,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
200V
|
10A
|
1.25V @ 10A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
10µA @ 200V
|
Through Hole
|
TO-220-3
|
BYQ28E-200/H,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
200V
|
10A
|
1.25V @ 10A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
10µA @ 200V
|
Through Hole
|
TO-220-3
|
BYV32E-100,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
100V
|
20A
|
1.15V @ 20A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
30µA @ 100V
|
Through Hole
|
TO-220-3
|
BYQ28E-200E,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
200V
|
10A
|
1.25V @ 10A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
10µA @ 200V
|
Through Hole
|
TO-220-3
|
BYQ30E-200,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
200V
|
16A
|
1.25V @ 16A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
30µA @ 200V
|
Through Hole
|
TO-220-3
|
BYV32E-150,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
150V
|
20A
|
1.15V @ 20A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
30µA @ 150V
|
Through Hole
|
TO-220-3
|
STTH1302CT |
STMICROELECTRONICS |
|
1 Pair Common Cathode
|
Standard
|
200V
|
6.5A
|
1.1V @ 6.5A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
6µA @ 200V
|
Through Hole
|
TO-220-3
|