STTH2003CR |
STMICROELECTRONICS |
|
1 Pair Common Cathode
|
Standard
|
300V
|
10A
|
1.25V @ 10A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
35ns
|
20µA @ 300V
|
Through Hole
|
TO-262-3 Long Leads, I²Pak, TO-262AA
|
STTH2003CT |
STMICROELECTRONICS |
|
1 Pair Common Cathode
|
Standard
|
300V
|
10A
|
1.25V @ 10A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
35ns
|
20µA @ 300V
|
Through Hole
|
TO-220-3
|
STTH2003CG |
STMICROELECTRONICS |
|
1 Pair Common Cathode
|
Standard
|
300V
|
10A
|
1.25V @ 10A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
35ns
|
20µA @ 300V
|
Surface Mount
|
TO-263-3, D²Pak (2 Leads + Tab), TO-263AB
|
STTH2003CG-TR |
STMICROELECTRONICS |
|
1 Pair Common Cathode
|
Standard
|
300V
|
10A
|
1.25V @ 10A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
35ns
|
20µA @ 300V
|
Surface Mount
|
TO-263-3, D²Pak (2 Leads + Tab), TO-263AB
|
STTH2003CFP |
STMICROELECTRONICS |
|
1 Pair Common Cathode
|
Standard
|
300V
|
10A
|
1.25V @ 10A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
35ns
|
20µA @ 300V
|
Through Hole
|
TO-220-3 Full Pack
|
BYQ28E-200,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
200V
|
10A
|
1.25V @ 10A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
10µA @ 200V
|
Through Hole
|
TO-220-3
|
BYQ28E-200/H,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
200V
|
10A
|
1.25V @ 10A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
10µA @ 200V
|
Through Hole
|
TO-220-3
|
BYQ28X-200,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
200V
|
10A
|
1.25V @ 10A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
10µA @ 200V
|
Through Hole
|
TO-220-3 Isolated Tab
|
BYQ28E-200E,127 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
200V
|
10A
|
1.25V @ 10A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
10µA @ 200V
|
Through Hole
|
TO-220-3
|
BYQ28ED-200,118 |
NXP SEMICONDUCTORS |
|
1 Pair Common Cathode
|
Standard
|
200V
|
10A
|
1.25V @ 10A
|
Fast Recovery =< 500ns, > 200mA (Io)
|
25ns
|
10µA @ 200V
|
Surface Mount
|
TO-252-3, DPak (2 Leads + Tab), SC-63
|